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Mots clés
EPR
Epitaxial growth
Auger electron spectroscopy AES
Nuclear reaction analysis
X-ray diffraction
Measurement
Silica
27Aldp
ALD
Topological insulators
Energy loss
Ferromagnetic resonance
27Alda
Pb centers
Evaluation
Ion beam analysis
Multilayer
Photoluminescence
Thin films
7630Lh
17O
Pulsed laser deposition
Magnetization curves
Indium oxide
6855Jk
Aluminium
Nickel
Oxygen deficiency
Isotopic Tracing
Hysteresis
Rutherford backscattering spectrometry RBS
PIXE
Metal-insulator transition
Interface defects
Kossel diffraction
Periodic multilayer
Transparent conductive oxide TCO
Magnetic semiconductors
Adsorption
18O resonance
Acoustic
Capillary condensation
Annealing
Passivation
Silicon
Nanostructures
Nanoparticles
Raman spectroscopy
7550Pp
Channeling
XRD
HfO2
17Opp
Nitridation
Gold
RBS
27Ald p&α
Thin film
Oxidation
Density functional theory
NRP
Magnetic anisotropy
GaMnAs
Growth
Adsorption Isotherms
Silicon carbide
Al2O3
Topological defects
AC susceptibility
Ion implantation
Atomic Layer Deposition ALD
Low energy electron diffraction LEED
Stable isotopic tracing
AFM
2H
18O
Acoustic propreties of solid
ADSORPTION DESORPTION HYSTERESIS
Alloy
Diffusion
Epitaxy
Nuclear resonance profiling NRP
7550Ee
8140Ef
Zinc oxide
Alloys
SiC
Adsorbed layers
Aluminum
13C
Sputtering
3C-SiC
XPS
Charge exchange
Silicon Carbide
15N
Defects
17Op
Gallium oxide
Ageing