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Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction

Audrey Leong-Hoï R. Claveau M. Flury 1 W. Uhring 2 Bruno Serio 3 Freddy Anstotz Paul C. Montgomer
1 LHC - Laboratoire Hubert Curien [Saint Etienne]
2 InESS - Institut d'Electronique du Solide et des Systèmes
3 LEME - Laboratoire Energétique Mécanique Electromagnétisme
Keywords : Rayonnement
Document type :
Conference papers
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https://hal-univ-paris10.archives-ouvertes.fr/hal-01421667
Contributor : Administrateur Hal Nanterre <>
Submitted on : Thursday, December 22, 2016 - 4:27:30 PM
Last modification on : Thursday, March 5, 2020 - 5:38:44 PM

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CNRS | UNIV-PARIS10 | UNIV-ST-ETIENNE | IOGS | PARISTECH | LEME | UNIV-PARIS-LUMIERES | UDL

Citation

Audrey Leong-Hoï, R. Claveau, M. Flury, W. Uhring, Bruno Serio, et al.. Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction. Proceedings of SPIE Optical Metrology, 22 June 2015, Jun 2015, Munich, Germany. pp.952807--952807--12, ⟨10.1117/12.2184559⟩. ⟨hal-01421667⟩

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